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Global Thin Film Metrology Systems Market 2014-2018

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LONDON, June 23, 2014 /PRNewswire/ -- Reportbuyer.com has added a new market research report:

Global Thin Film Metrology Systems Market 2014-2018

http://www.reportbuyer.com/industry_manufacturing/machinery/global_thin_film_metrology_systems_market_2014_2018.html

TechNavio's analysts forecast the Global Thin Film Metrology Systems market to grow at a CAGR of 5.02 percent over the period 2013-2018. One of the key factors contributing to this market growth is the high demand for thin film metrology systems for the development of flat panel displays. The Global Thin Film Metrology Systems market has also been witnessing the increased R&D spending by vendors. However, the cyclical nature of the semiconductor industry could pose a challenge to the growth of this market.

TechNavio's report, the Global Thin Film Metrology Systems Market 2014-2018, has been prepared based on an in-depth market analysis with inputs from industry experts. The report covers the Americas, EMEA, and APAC; it also covers the Global Thin Film Metrology Systems market landscape and its growth prospects in the coming years. The report also includes a discussion of the key vendors operating in this market.

Key vendors dominating this space include Nanometrics Inc., Nova Measuring Instruments, KLA-Tencor Corp., and Rudolph Technologies Inc.

Other vendors mentioned in the report are Dainippon Screen Mfg Co. Ltd., FIE Co., HORIBA Ltd., Jordan Valley Semiconductors Ltd., Ocean Optics Inc., ReVera Inc., Semilab Co. Ltd., Scientific Computing International, and Windsor Scientific

Key questions answered in this report:

What will the market size be in 2018 and what will be the growth rate?
What are key market trends?
What is driving this market?
What are the challenges to market growth?
Who are the key vendors in this market space?
What are the market opportunities and threats faced by key vendors?
What are the strengths and weaknesses of each of these key vendors?

You can request one free hour of our analyst's time when you purchase this market report. Details provided within the report.

Methodology

Research methodology is based on extensive primary and secondary research. Primary research includes in-depth interviews with industry experts, vendors, resellers and customers. Secondary research includes Technavio Platform, industry publications, company reports, news articles, analyst reports, trade associations and the data published by Government agencies.
01. Executive Summary
02. List of Abbreviations
03. Scope of the Report
03.1 Market Overview
03.2 Product Offerings
04. Market Research Methodology
04.1 Market Research Process
04.2 Research Methodology
05. Introduction
06. Market Landscape
06.1 Market Size and Forecast
06.2 Five Forces Analysis
07. Geographical Segmentation
07.1 Global Thin Film Metrology Systems Market by Geographical Segmentation 2013
07.2 Thin Film Metrology Systems Market in the APAC Region
07.2.1 Market Size and Forecast
07.3 Thin Film Metrology Systems Market in the Americas
07.3.1 Market Size and Forecast
07.4 Thin Film Metrology Systems Market in the EMEA Region
07.4.1 Market Size and Forecast
08. Key Leading Countries
08.1 South Korea
08.2 US
08.3 Taiwan
09. Buying Criteria
10. Market Growth Drivers
11. Drivers and their Impact
12. Market Challenges
13. Impact of Drivers and Challenges
14. Market Trends
15. Trends and their Impact
16. Vendor Landscape
16.1 Competitive Scenario
16.2 Other Prominent Vendors
17. Key Vendor Analysis
17.1 Nanometrics Inc.
17.1.1 Business Overview
17.1.2 SWOT Analysis
17.2 Nova Measuring Instruments
17.2.1 Business Overview
17.2.2 SWOT Analysis
17.3 KLA-Tencor Corp.
17.3.1 Business Overview
17.3.2 Business Segmentation of KLA-Tencor Corp. 2013
17.3.3 SWOT Analysis
17.4 Rudolph Technologies Inc.
17.4.1 Business Overview
17.4.2 Business Segmentation of Rudolph Technologies Inc. 2013
17.4.3 SWOT Analysis
18. Other Reports in this Series

List of Exhibits

Exhibit 1: Market Research Methodology
Exhibit 2: Global Thin Film Metrology Systems Market 2013-2018 (US$ million)
Exhibit 3: Global Thin Film Metrology Systems Market by Geographical Segmentation 2013
Exhibit 4: Thin Film Metrology Systems Market in the APAC Region 2013-2018 (US$ million)
Exhibit 5: Thin Film Metrology Systems Market in the Americas 2013-2018 (US$ million)
Exhibit 6: Thin Film Metrology Systems Market in the EMEA Region 2013-2018 (US$ million)
Exhibit 7: Thin Film Metrology Systems Market in South Korea 2013-2018 (US$ million)
Exhibit 8: Thin Film Metrology Systems Market in the US 2013-2018 (US$ million)
Exhibit 9: Taiwan Thin Film Metrology Systems Market 2013-2018 (US$ million)
Exhibit 10: Business Segmentation of KLA-Tencor Corp. 2013
Exhibit 11: Business Segmentation of KLA-Tencor Corp. FY2013
Exhibit 12: Business Segmentation of Rudolph Technologies Inc. 2013
Exhibit 13: Business Segmentation of Rudolph Technologies Inc. by Revenue 2013

Companies Mentioned

Nanometrics Inc., Nova Measuring Instruments, KLA-Tencor Corp., and Rudolph Technologies Inc.

Read the full report:
Global Thin Film Metrology Systems Market 2014-2018

http://www.reportbuyer.com/industry_manufacturing/machinery/global_thin_film_metrology_systems_market_2014_2018.html

For more information:
Sarah Smith
Research Advisor at Reportbuyer.com
Email: query@reportbuyer.com  
Tel: +44 208 816 85 48
Website: www.reportbuyer.com

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